Reliable Systems

University

Goals

To develop new, reliable manufacturing and self-testing methods for systems and components in harsh environments

Issues

Oscillation-based self-testing of electronics and microelectronics; Real-time DC parameter degradation monitoring in electronics; statistical analysis of test resilience over PVT variation; parametric degradation of microelectronics due to ionozing radiation; reliability of additively manufactured RF components; additively manufactured geometries and processes best suited to harsh environments.

Tools and Methods

Oscillation-based testing

FEM analysis

Circuit design

Compact modelling

Additive manufacturing

Environmental testing

Monte Carlo analysis

Neural Networks

Bayesian statistics

Desired Majors

Electronic Engineering

Mechanical Engineering

Industrial Engineering

Physics

Computer Science

Computer Engineering

Statistics

Prep

EE: Circuit design, microelectronic design, electromagnetics, metrology IE: Statistical analysis, manufacturing processes ME: Precision manufacturing, additive manufacturing, material science, FEM analysis Physics: nuclear physics, semiconductor physics.